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Volume 5, No. 3, pp. 159--230, 1991
- Pattern-specific contrast threshold elevation
P. Flanagan and P.C.Dodwell 159- Detection symmetry and asymmetry
J.M.H. Du Buf 189- Spatial frequency difference thresholds depend on stimulusarea
D.W. Heeley 205- Matching the orientation of dot patterns with real, interpolated,and extrapolated lines
P. Lánský, N. Yakimoff, J. Mates and V. diMaio 219
VSPPostal address: P.O. Box 9000, 2300 PA Leiden, The Netherlands
Office address: Plantijnstraat 2, 2321 JC Leiden, The Netherlands
Tel: +31 71 535 3500, Fax: +31 71 531 7532
E-mail: vsppub@brill.nl
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About VSP 28 VSP Books Acid-Base Interactions: Relevance to Adhesion Science andTechnology 31 Adhesion Aspects of Polymeric Coatings, Volume 2 Adhesion Aspects of Thin Films, Volume 1 Adhesive Joints: Formation, Characteristics and Testing, Volume 2 Adhesion Measurement of Films and Coatings Adhesion Measurement of Films and Coatings, Volume 2 Apparent and Microscopic Contact Angles 39 Acid-Base Interactions: Relevance to Adhesion Science and Technology: Contents Adhesion Aspects of Polymeric Coatings, Volume 2: Contents Adhesion Aspects of Thin Films, Volume 1: Contents Adhesive Joints: Formation, Characteristics and Testing, Volume 2: Contents Adhesion Measurement of Films and Coatings: Contents Adhesion Measurement of Films and Coatings, Volume 2: Contents Apparent and Microscopic Contact Angles: Contents An Atlas of Selected Galaxies